Specimen analyzer, abnormality control method of the same and computer program product
US8778268B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 21, 2008 |
| Grant date | Jul 15, 2014 |
| Priority date | — |
| Expiry date | Sep 10, 2031 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T436/113332
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Specimen analyzer includes a first holding section for holding a container; a first mechanism section for executing a first operation for the container on the first holding section; a second holding section for holding the container; a first transfer mechanism section for transferring the container from the first holding section to the second one; a second mechanism section for executing a second operation for the container on the second one; an error detector for detecting error in the first mechanism section; and an error controller for controlling the operation of the first holding section, the first and second operation so that the first operation and the transfer operation of the first holding section would be stopped while the second operation would be continued in case of the error in the first mechanism section. An abnormality control method of the analyzer and computer program product are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.