Patent · US Active

Method of manufacturing high resolution organic thin film pattern

US8778600B2 · kind B2 · utility

7Cited by
1References
20Claims
0Family size

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Key dates

Filing dateDec 27, 2010
Grant dateJul 15, 2014
Priority date
Expiry dateMar 26, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10K71/12

Abstract

A method of forming a high resolution organic thin film pattern, the method including forming a first organic layer on a substrate; selectively removing the first organic layer by selectively irradiating light energy onto the first organic layer, and forming a remaining part of the first organic layer as a sacrifice layer; forming a second organic layer on the substrate and the entire surface of the sacrifice layer; and lifting off the second organic layer formed on the sacrifice layer by removing the sacrifice layer using a solvent, and forming the remaining second organic layer as a second organic layer pattern.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.