Method and system for providing a dual curtain gas to a mass spectrometry system
US8779356B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 14, 2011 |
| Grant date | Jul 15, 2014 |
| Priority date | — |
| Expiry date | Sep 14, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/044
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A system and method for mass spectrometry including a curtain gas chamber defined by a curtain plate having an aperture for receiving ions from an ion source and an orifice plate having an inlet into a mass spectrometer. At least one barrier separates the curtain chamber into a first curtain gas chamber region and a second curtain gas chamber region. At least one gas source provides a gas inflow into the second curtain gas chamber region and a gas outflow into the first curtain gas chamber region, a portion of the gas outflow directed out of the aperture. A heating element heats the gas inflow, a portion of the heated gas inflow directed into the inlet of the mass spectrometer wherein the portion of the heated gas inflow can be at a substantially higher temperature than the portion of the gas outflow.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.