Burn-in testing apparatus
US8779788B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 30, 2011 |
| Grant date | Jul 15, 2014 |
| Priority date | — |
| Expiry date | Jan 29, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G3/006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing apparatus includes a thermal control chamber including a test room, which temperature is controlled within a testing temperature range; a carrier frame including a direction guiding unit installed securely within the test room and formed with one guiding groove and a carrier rod extending through the guiding groove in the direction guiding unit; and a clamping unit mounted on the carrier rod for clamping a display-panel module securely, wherein, movement of the carrier rod transversely within the guiding groove relative to the direction guiding unit results in disposing the display-panel module to extend along one of several testing directions for undergoing a burn-in test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.