Imaging system and method using partial-coherence speckle interference tomography
US8780182B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 31, 2010 |
| Grant date | Jul 15, 2014 |
| Priority date | — |
| Expiry date | Jun 24, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V40/161
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for generating an image of contoured surface includes a light source that is configured to project an electromagnetic radiation beam onto the contoured surface, wherein the projected beam generates first radiation reflected from a first portion of the contoured surface to form a speckle pattern, and second radiation reflected from a second portion of the contoured surface which is substantially uniform in intensity. The reflected first and second reflected radiation is received by an optical detector, and may be processed. The processing is configured to (1) generate a plurality of images from the first and second reflected radiation, with each image being generated using different coherence length electromagnetic radiation from the light source, and (2) generate a 3-D image of the contoured surface from the plurality of images. Methods for generating a 3-D image of a contoured surface are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.