System and method for eliminating the effect of non-primary laser modes on characterization of optical components through characterized decomposition
US8780337B2 · kind B2 · utility
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Key dates
| Filing date | Jul 21, 2012 |
| Grant date | Jul 15, 2014 |
| Priority date | — |
| Expiry date | Aug 22, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/33
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and a system for characterization of optical components through characterized decomposition of an optical device includes: directing incident light over a range of wavelengths to a device under test, wherein the incident light includes a primary signal and at least one sideband signal, the distance between the primary signal and any one of the sideband signals is substantially larger than the width of the band pass area of the device under test; detecting output light from the device under test to obtain a detected signal; correcting the detected signal to account errors associated with the sideband signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.