Patent · US Active

Marker-free chromosome screening

US8780354B2 · kind B2 · utility

0Cited by

3References

15Claims

0Family size

Assignee

Hochschule Reutlingen · DE

Inventors

Rudolf Kessler · Reutlingen, DE
Tobias Merz · Thun, CH
Karsten Rebner · Leinfelden, DE

Key dates

Filing date	Feb 19, 2009
Grant date	Jul 15, 2014
Priority date	—
Expiry date	Jun 15, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG01N21/31
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The present invention relates to a method for analyzing chromosomes through preparing a chromosome preparation, measuring at least one interference characteristic of the chromosome preparation and characterizing at least one chromosome structure by way of the interference characteristic. Also, the invention relates to the use of a near-field microscope for analyzing un-dyed chromosomes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.