Device for measuring the degree of bending of an intramedullary nail
US8784428B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 19, 2011 |
| Grant date | Jul 22, 2014 |
| Priority date | — |
| Expiry date | Apr 6, 2032 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B2090/067
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A device for measuring a degree of bending of an intramedullary nail comprises a probe sized and shaped for insertion into a cannulation of an intramedullary nail. The probe including a first longitudinal element extending along a longitudinal axis from a distal end to a proximal end and a second longitudinal element extending along a longitudinal axis from a distal end to a proximal end, the distal ends of the first and second longitudinal elements attached to one another so that the longitudinal axes of the first and second longitudinal elements extend substantially parallel to each other and define a middle plane. A measuring element measures relative axial displacement of the proximal ends of the first and second longitudinal elements in the middle plane upon bending of the first and second longitudinal elements as the probe is inserted into a cannulation of the intramedullary nail.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.