System and methods to improve the performance of semiconductor based sampling system
US8786318B2 · kind B2 · utility
1Cited by
15References
24Claims
0Family size
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Key dates
| Filing date | Jun 8, 2011 |
| Grant date | Jul 22, 2014 |
| Priority date | — |
| Expiry date | Nov 28, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C27/024
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Circuits and methods that improve the performance of electronic sampling systems are provided. Impedances associated with sampling semiconductor switches are maintained substantially constant during sample states, at least in part, by compensating for encountered input signal variations in order to reduce or minimize signal distortion associated with sampled signals that pass through the sampling switch.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.