Systems and methods for estimating a parameter for a 3D model
US8786595B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Jun 10, 2009 |
| Grant date | Jul 22, 2014 |
| Priority date | — |
| Expiry date | Jul 10, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2210/52
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention estimates parameters for 3D models. Parameters may include, without limitation, surface topology, edge geometry, luminous or reflective characteristics, visual properties, characterization of noise in the signal, or other. A metric is estimated by quantifying a relationship between a received signal and a reference signal. The metric is then utilized to determine a parameter for a 3D model. The metric may include a measurement such as the cross-correlation of the received signal and the reference signal, or standard deviation of the difference of the received signal and the reference signal, for example. The parameter obtained may then be used to create a reference signal for determination of another parameter.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.