Luminance measurement method, luminance measurement device, and image quality adjustment technique using the method and device
US8786712B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 1, 2013 |
| Grant date | Jul 22, 2014 |
| Priority date | — |
| Expiry date | Nov 1, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/0002
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Provided is a luminance measurement method for accurately measuring luminance of each pixel even if pixel images of a display panel overlap each other on an imaging surface of a camera. Pixels of a display panel are imaged by a solid-state imaging camera. One or more pixels are turned on and imaged such that pixel images do not overlap each other on an imaging surface. A central exposure factor indicating luminance of the central part of the pixel image is calculated based on a picture element output corresponding to the central part. A peripheral exposure factor indicating luminance of the peripheral part of the pixel image is calculated based on a picture element output corresponding to the peripheral part. All pixels are turned on and imaged, and luminance of all pixels is calculated based on this imaged image, the central exposure factor, and the peripheral exposure factor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.