Measurement of liquid fraction dropout using micropatterned surfaces
US8786860B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 20, 2011 |
| Grant date | Jul 22, 2014 |
| Priority date | — |
| Expiry date | Sep 6, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/556
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Accurate, real-time detection of dew point of a gaseous sample can be accomplished using the systems and techniques described herein. A gaseous sampling chamber defining an interior volume includes a patterned structure having a roughened surface exposed to the gaseous sampling chamber. The patterned structure includes an open volume accessible by the roughened surface, for example, representing at least about 10% of the interior volume of the gaseous sampling chamber. An illumination source is configured to illuminate at least a portion of the patterned structure. A light detector is configured to receive at least a portion of illumination returned from the patterned structure. A condensate detector is configured to determine a presence of a condensate on the roughened surface in response to an optical property of the patterned surface as modified by the presence of dew.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.