Patent · US Active

Apparatus and method for determining inner profiles of hollow devices

US8786866B2 · kind B2 · utility

0Cited by

4References

17Claims

0Family size

Assignee

Baker Hughes Holdings LLC · US

Inventors

Frederik Goeing · Wathlingen, DE
Marc Aldag · Sulingen, DE
Gunnar Michaelis · Winsen (Aller), DE
Harald Grimmer · Celle, DE

Key dates

Filing date	Mar 2, 2012
Grant date	Jul 22, 2014
Priority date	—
Expiry date	Mar 2, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG01B2210/50
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In one aspect, an apparatus for determining an internal profile of a measured device is provided, which method in one embodiment may include: a housing having a first axis, a measuring device configured to emit a light beam along a second axis offset from the first axis; a deflection device configured to direct the emitted light beam to an inner surface of the measured device; and a driver configured to rotate the measuring device about the first axis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.