Radiation imaging device
US8787520B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 24, 2009 |
| Grant date | Jul 22, 2014 |
| Priority date | — |
| Expiry date | Feb 19, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/00
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
Disclosed is an X-ray imaging apparatus in which a correction function used to correct scattered X-rays and a correction function used to correct beam hardening can be simply and precisely determined so that the correcting operations are performed in an appropriate sequence using the correction functions thus determined to enhance the precision in the correction and improve the image quality. The scattered X-rays and the beam hardening are corrected sequentially in this order, using the scattered X-ray correction function and the beam hardening correction function, both calculated using measured data for calculating the correction functions. The scattered X-ray correction function approximates as to each transmission distance, the data measured with changes in the transmission distance and with changes in the scattered X-ray amount, and associates the correction value thus obtained with transmittance data. Upon calculation of the beam hardening correction function, data measured with changes in the transmission distance is converted into projection data and is linearly approximated to obtain an ideal amount of beam hardening.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.