Measuring method of critical current density of superconductor wires using measurement of magnetization loss
US8788227B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jul 28, 2010 |
| Grant date | Jul 22, 2014 |
| Priority date | — |
| Expiry date | Feb 17, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R19/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for measuring critical current density of superconductor wires according to the present invention is characterized in that it includes: (a) applying an external magnetic field to the superconductor wires, (b) measuring a magnetization loss of the superconductor wires according to the application of the external magnetic field, (c) normalizing the measured magnetization loss, and then calculating a fully-penetration magnetic field of the superconductor wires according to the normalized magnetization loss, (d) calculating a critical current density of the superconductor wires according to the calculated fully-penetration magnetic field. Therefore, the critical current density of parallel superconductor wires such as stacked superconductor wires may be measured without applying current to the superconductor wires directly.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.