Patent · US Expired

System and method for configuring semiconductor functional circuits

US8788996B2 · kind B2 · utility

4Cited by
267References
31Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 18, 2003
Grant dateJul 22, 2014
Priority date
Expiry dateMar 30, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention systems and methods enable configuration of functional components in integrated circuits. A present invention system and method can flexibly change the operational characteristics of functional components in an integrated circuit die based upon a variety of factors. In one embodiment, manufacturing yields, compatibility characteristics, performance requirements, and system health (e.g., the number of components operating properly) are factored into changes to the operational characteristics of functional components. In one exemplary implementation, the changes to operational characteristics of a functional component are coordinated with changes to other functional components. Workflow scheduling and distribution is also adjusted based upon the changes to the operational characteristics of the functional components. For example, a functional component configuration controller changes the operational characteristics settings and provides an indication to a workflow distribution component. The workflow distribution component changes the workflow schedule based upon the operational characteristics settings (e.g., work flow is diverted to or away from functional co…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.