Device for measuring the temperature of a substrate
US8790008B2 · kind B2 · utility
1Cited by
20References
17Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 3, 2011 |
| Grant date | Jul 29, 2014 |
| Priority date | — |
| Expiry date | May 21, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K7/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for measuring the temperature of a substrate comprising a thermocouple comprising electric wires joined to each other at least one junction; a fixing element suitable for fixing said junction to said substrate in order to measure its temperature; characterized in that the fixing element comprises a thermally conductive element suitable for bearing a portion of electric wires adjacent to said junction; said thermally conductive element being capable of thermally coupling said portion of electric wires to said substrate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.