System and method for integrated circuit calibration
US8793091B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 10, 2008 |
| Grant date | Jul 29, 2014 |
| Priority date | — |
| Expiry date | Aug 27, 2029 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L25/0278
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for calibrating an integrated circuit. The method includes configuring a first impedance for a first output of the integrated circuit according to a first configuration code and measuring a first voltage at the first output which corresponds to the first configuration code. The method further includes configuring a second impedance for a second output of the integrated circuit according to a second configuration code and measuring a second voltage at the second output which corresponds to the second configuration code. A determination of which of the first voltage and the second voltage is nearest to a predetermined voltage value. Based on the voltage determination, the integrated circuit is configured according a code of said first and second codes that corresponds to the voltage nearest to the predetermined voltage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.