Patent · US Active

Three-dimensional model determination from two-dimensional sketch with two-dimensional refinement

US8793108B2 · kind B2 · utility

3Cited by

1References

20Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Yunhua Fu · Princeton, US
Richard Gary McDaniel · Hightstown, US

Key dates

Filing date	Mar 29, 2012
Grant date	Jul 29, 2014
Priority date	—
Expiry date	Jan 24, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG06F2111/04
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A three-dimensional model is determined from a two-dimensional sketch. Rather than or in addition to modification of 3D constraints to reduce gaps in the 3D model, 2D constraints are modified. The geometry of the 2D sketch is altered in the view plane (x, y) or 2D input instead of maintaining the geometry of the 2D sketch and only modifying in the view direction (z). Gaps may be reduced through alteration of the 2D geometry.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.