Patent · US Active

Test and measurement instrument with auto-sync for bit-error detection

US8793536B2 · kind B2 · utility

2Cited by
7References
22Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 22, 2012
Grant dateJul 29, 2014
Priority date—
Expiry dateApr 6, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3171
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Embodiments of the invention include methods, apparatuses, and systems for automatically identifying a synchronization sub-pattern associated with a test pattern. A test and measurement instrument is triggered in response to a first instance of a trigger pattern in a data stream. A trigger-to-trigger counter begins counting at the time of the first trigger event. The test and measurement instrument is again triggered in response to a second instance of the trigger pattern in the data stream. The count is ended at this time. The count is then compared to a predefined length of the test pattern, and if equal, it is automatically determined that the trigger pattern is the unique synchronization sub-pattern associated with the test pattern.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.