Ionization probe assemblies
US8796617B2 · kind B2 · utility
2Cited by
231References
40Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 3, 2012 |
| Grant date | Aug 5, 2014 |
| Priority date | — |
| Expiry date | Jan 3, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/0468
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates generally to sample ionization, and provides ionization probe assemblies, systems, computer program products, and methods useful for this purpose.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.