Patent · US Active

Ionization probe assemblies

US8796617B2 · kind B2 · utility

2Cited by
231References
40Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 3, 2012
Grant dateAug 5, 2014
Priority date
Expiry dateJan 3, 2032

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/0468
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention relates generally to sample ionization, and provides ionization probe assemblies, systems, computer program products, and methods useful for this purpose.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.