Spectrometer design for aberration correction, simplified manufacture, and compact footprint
US8797529B2 · kind B2 · utility
1Cited by
11References
4Claims
0Family size
Assignee
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Key dates
| Filing date | Jan 22, 2012 |
| Grant date | Aug 5, 2014 |
| Priority date | — |
| Expiry date | Jan 11, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/18
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectrometer design method that corrects aberration by using crossed optical paths and minor alignment, simplifies manufacture by applying the light entrance slit and aperture on opposite sides of a transparent input block, and creates a more compact footprint by placing a 45 degree mirror or right angle prism directly in front of the detector is disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.