Atmospheric measurement system
US8797550B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 19, 2011 |
| Grant date | Aug 5, 2014 |
| Priority date | — |
| Expiry date | Nov 28, 2032 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02A90/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A fringe pattern from an interferometer is imaged onto a digital micromirror device containing an array of micromirrors in an associated pattern of pixel mirror rotational states that provide for sampling the circular fringe pattern in cooperation with one or more associated photodetectors, so as to provide for generate a corresponding set of associated complementary signals. A plurality of different sets of associated complementary signals generated for a corresponding plurality of mutually independent associated patterns of pixel mirror rotational states are used to determine at least one metric associated with the circular fringe pattern.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.