Patent · US Active

TFT mask reduction

US8801948B2 · kind B2 · utility

0Cited by
4References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 11, 2012
Grant dateAug 12, 2014
Priority date
Expiry dateOct 17, 2032

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D86/0231
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Embodiments of the present disclosure relate to display devices and methods for manufacturing display devices. Specifically, embodiments of the present disclosure employ a halftone photoresist layer useful for reducing a number of masks needed to manufacture TFT backplane (e.g., thin-film transistors (TFTs) with fringe-field shifting). The halftone photoresist layer defines two areas, one defining an etching area for a first layer (e.g., a common voltage layer) and the other defining an etching area for a second layer (e.g., an organic passivation layer).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.