Self calibration approach for mass spectrometry
US8803080B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 2, 2008 |
| Grant date | Aug 12, 2014 |
| Priority date | — |
| Expiry date | Mar 18, 2031 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB01D59/44
- WIPO fieldChemical engineering
- WIPO sectorChemistry
Abstract
Methods for analyzing mass spectral data, include acquiring profile mode mass spectral data containing at least on ion of interest whose elemental composition is determined; obtaining a correct peak shape function based on the actually measured peak shape of at least one of the isotypes of the same ion of interest; generating at least one possible elemental composition for the ion of interest; calculating a theoretical isotope distribution for the elemental composition and a theoretical isotope cluster by applying correct peak shape function to the theoretical isotope distribution; comparing quantiatively the corresponding parts of the theoretical isotope cluster to that from acquired profile mode mass spectral data to obtain at least one of elemental composition determination, classification, or quantitation for the ion. A computer for and a computer readable medium having computer readable code thereon for performing the methods. A mass spectrometer having an associated computer for performing the methods.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.