Galvanically isolated functional test for components

US8803540B2 · kind B2 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Simon Hüttinger · Erlangen, DE
• Thomas Komma · Ottobrunn, DE
• Kai Kriegel · Birkenfeld, DE
• Jürgen Rackles · Puchheim, DE
• Gernot Spiegelberg · Bad Abbach, DE

Key dates

• Filing date: Jan 13, 2010
• Grant date: Aug 12, 2014
• Expiry date: Sep 18, 2030

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/40
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method and a circuit functionally test a semiconductor component. The functional test is performed with galvanic isolation by using a transformer. The test itself is based on determining the frequency-dependent impedance of a series circuit of capacitors and inductors using the semiconductor component itself. The impedance is strongly influenced by the conduction state of the semiconductor component, in other words, by the instantaneous conductivity or blocking capability of the semiconductor component.