Estimating wear of non-volatile, solid state memory
US8806106B2 · kind B2 · utility
20Cited by
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18Claims
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Key dates
| Filing date | Nov 12, 2010 |
| Grant date | Aug 12, 2014 |
| Priority date | — |
| Expiry date | Feb 16, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/50
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Completion times of data storage operations targeted to a non-volatile, solid-state memory device are measured. Wear of the memory device is estimated using the measured completion times, and life cycle management operations are performed to affect subsequent wear of the memory device in accordance with the estimated wear. The life cycle management may include operations such as wear leveling, predicting an end of service life of the memory device, and removing worn blocks of the memory device from service.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.