Automatic and on-demand testing of non-volatile storage devices
US8806283B1 · kind B1 · utility
2Cited by
20References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 15, 2011 |
| Grant date | Aug 12, 2014 |
| Priority date | — |
| Expiry date | Jun 13, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/0407
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods for testing non-volatile storage devices are disclosed that provide functionality to control when testing of the non-volatile storage device is performed. In one embodiment, information stored in persistent memory indicates whether testing is enabled or disabled. For example, the testing information may indicate that testing is to be performed upon a first initialization of a non-volatile storage device, but not in connection with subsequent power-up events. Furthermore, functionality is disclosed for re-running and/or bypassing testing of the non-volatile storage device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.