Patent · US Active

Impact analysis and adoption planning based on global where-used lists

US8806422B2 · kind B2 · utility

3Cited by
16References
19Claims
0Family size

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Key dates

Filing dateOct 27, 2011
Grant dateAug 12, 2014
Priority date
Expiry dateMay 18, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F8/71
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Local dependency metadata can be collected from local metadata repositories of a plurality of development systems in a layered development system landscape, and a global where-used list that includes intra-layer and inter-layer dependencies between development entities in a layered development system landscape can be created, for example by aggregating the collected local dependency data. A usage metric quantifying how frequently each development entity is depended upon by other development entities in the layered development system landscape can be assigned to each development entity in the layered development system landscape. A measure of a relative effect of a change to one of the development entities on other development entities in the layered development system landscape can be promoted.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.