Automated testing process
US8806437B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 29, 2011 |
| Grant date | Aug 12, 2014 |
| Priority date | — |
| Expiry date | Oct 22, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3698
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, computer program product, and system for automating a test environment is provided. The method may include providing, at one or more computing devices, a superclass and a class-under-test, the superclass and the class-under-test having an inheritance chain therebetween. The method may further include inserting, via the computing device, an intermediate mock class between the superclass and the class-under-test. The method may also include automatically modifying, via the computing device, the class-under-test at runtime.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.