Patent · US Active

Automated testing process

US8806437B2 · kind B2 · utility

6Cited by
6References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 29, 2011
Grant dateAug 12, 2014
Priority date
Expiry dateOct 22, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/3698
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method, computer program product, and system for automating a test environment is provided. The method may include providing, at one or more computing devices, a superclass and a class-under-test, the superclass and the class-under-test having an inheritance chain therebetween. The method may further include inserting, via the computing device, an intermediate mock class between the superclass and the class-under-test. The method may also include automatically modifying, via the computing device, the class-under-test at runtime.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.