Method and apparatus for determining a thickness profile of an ophthalmic lens using a single point thickness and refractive index measurements
US8810784B2 · kind B2 · utility
2Cited by
14References
4Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 11, 2013 |
| Grant date | Aug 19, 2014 |
| Priority date | — |
| Expiry date | Feb 11, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/025
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
This invention provides for a method and an ophthalmic lens thickness profile measuring apparatus. More specifically, the apparatus which is capable of measuring the ophthalmic lens in a precursor state after it is free-formed on an optic forming mandrel on which it can be formed. Additionally, the present invention can also allow for a design profile of the formed ophthalmic lens to be compared to the resulting free-formed ophthalmic lens to ensure it meets specified convergence design criteria.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.