Structured light for 3D shape reconstruction subject to global illumination
US8811767B2 · kind B2 · utility
34Cited by
10References
19Claims
0Family size
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Key dates
| Filing date | Mar 15, 2011 |
| Grant date | Aug 19, 2014 |
| Priority date | — |
| Expiry date | Apr 5, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20221
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Depth values in a scene are measured by projecting sets of patterns on the scene, wherein each set of patterns is structured with different spatial frequency using different encoding functions. Sets of images of the scene is acquired, wherein there is one image for each pattern in each set. Depth values are determining for each pixel at corresponding locations in the sets of images. The depth values of each pixel are analyzed, and the depth value is returned if the depth values at the corresponding locations are similar. Otherwise, the depth value is marked as having an error.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.