Method and a device for finding imperfections in an RF path
US8811928B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 26, 2007 |
| Grant date | Aug 19, 2014 |
| Priority date | — |
| Expiry date | Oct 12, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/24
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
The invention discloses a method (700) for finding differences in path loss between a plurality of RF paths between a first (120, 130) and a second (120, 130) transceiver in a wireless communications system (100). During defined 5 intervals of time (SACCH1-SACCH4), only one RF path is used to transmit from one of said transceivers to the other of said transceivers, and the receiving transceiver measures the strength of the signal received during at least a number of said intervals, thus making it possible to compare signal strength and thereby path loss between different RF paths, which in turn 10 makes it possible to find imperfections in one or more of said RF paths.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.