Method for estimating defects in an object and device for implementing same
US8818075B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 28, 2010 |
| Grant date | Aug 26, 2014 |
| Priority date | — |
| Expiry date | Jan 18, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/9046
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a device and method for estimating defects potentially present in an object comprising an outer surface, wherein the method comprises the steps of: a) illuminating the outer surface of the object with an inductive wave field at a predetermined frequency; b) measuring an induced wave field ({right arrow over (H)}) at the outer surface of the object; c) developing from the properties of the object's material a coupling matrix T associated with a depth Z of the object from the outer surface; d) solving the matrix systemto determine a vector ({right arrow over (J)}) at depth Z; e) extracting a sub-vector ({right arrow over (J)}S) from the vector ({right arrow over (J)}) corresponding to a potential defect on the object at depth Z; and f) quantitatively estimating the potential defect from the sub-vector ({right arrow over (J)}S) at depth Z, wherein the method is performed using a computer or processor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.