Container thickness measuring systems and methods
US8818755B2 · kind B2 · utility
5Cited by
6References
21Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 12, 2011 |
| Grant date | Aug 26, 2014 |
| Priority date | — |
| Expiry date | Feb 4, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/90
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Various embodiments are directed to systems and methods for measuring a thickness of a container. For example, a control device may receive data indicating a surface topology of the container and based on the surface topology of the container, instruct a multi-axis positioning system to position a sensor relative to a first point of the container such that: a distance from the sensor to a surface at the first point is about equal to a predetermined distance; and the sensor direction is about normal to the surface at the first point. Data indicating the thickness at the first point may be received from the sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.