Nondestructive inspection apparatus and nondestructive inspection method using guided wave
US8820163B2 · kind B2 · utility
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16References
5Claims
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Key dates
| Filing date | Aug 26, 2011 |
| Grant date | Sep 2, 2014 |
| Priority date | — |
| Expiry date | Dec 20, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2634
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A nondestructive inspection apparatus includes a pair of guided wave sensors disposed on an outer surface of a piping and a guided wave inspection device connected to the pair of guided wave sensors which, outputs a transmitting signal for propagating a guided wave to the guided wave sensors, and obtains a receiving signal by receiving a propagated signal by the guided wave sensors. An inspection-result storage device stores the guided wave as a digitized signal of the received wave and an inspection-result diagnostic device performs arithmetic processing of judging whether or not a signal associated with a defect exists.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.