Methods and apparatus for automated facial feature localization
US8824808B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 31, 2012 |
| Grant date | Sep 2, 2014 |
| Priority date | — |
| Expiry date | Jul 31, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T5/77
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Various embodiments of methods and apparatus for facial retouching are disclosed. In one embodiment, a face in an input image is detected. One or more transformation parameters for the detected face are estimated based on a profile model. The profile model is applied to obtain a set of feature points for each facial component of the detected face. Global and component-based shape models are applied to generate feature point locations of each facial component of the detected face.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.