Patent · US Active

Methods and apparatus for automated facial feature localization

US8824808B2 · kind B2 · utility

11Cited by
4References
18Claims
0Family size

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Inventors

Key dates

Filing dateJul 31, 2012
Grant dateSep 2, 2014
Priority date
Expiry dateJul 31, 2032

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T5/77
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Various embodiments of methods and apparatus for facial retouching are disclosed. In one embodiment, a face in an input image is detected. One or more transformation parameters for the detected face are estimated based on a profile model. The profile model is applied to obtain a set of feature points for each facial component of the detected face. Global and component-based shape models are applied to generate feature point locations of each facial component of the detected face.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.