Systems and methods for dynamic temperature calibration of a frequency reference
US8824971B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 24, 2010 |
| Grant date | Sep 2, 2014 |
| Priority date | — |
| Expiry date | May 12, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/104
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A system and method are described for dynamic temperature calibration of a frequency reference in a wireless base station. In a consumer grade base station, a reference oscillator may encounter frequency drift as the temperature of the base station changes. This causes interference as the transmission signal is not synchronized with other frequency resources in a network. An improved method of calibrating a reference frequency includes measuring a frequency difference between a frequency derived from an accurate reference frequency in a first base station and a frequency derived from a less accurate frequency reference in a second base station, determining a calibration factor for the offset, and applying the calibration factor to the base station to correct frequency drift. The calibration factors may be correlated with an operating temperature of the base station and stored in a temperature calibration table in the base station device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.