Patent · US Active

Functional check and variance compensation in mass spectrometry

US8829429B2 · kind B2 · utility

3Cited by
0References
32Claims
0Family size

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Inventors

Key dates

Filing dateJun 18, 2010
Grant dateSep 9, 2014
Priority date
Expiry dateOct 26, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2030/045
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Test method checks and compensates ion yield variances in a mass spectrometer and includes feeding an eluate of a chromatographic separation to the spectrometer, continuously ad-mixing a separate target analyte solution at known concentration and constant flow rate to the eluate, injecting the mixture into the spectrometer and generating a detector signal for the mixture. A spectrogram is captured which includes an integration line and a mass-spectrographic peak of the target analyte, the integration line being a lasting background signal underlaid to the mass-spectrometric analysis of the eluate, then evaluating the spectrogram by capturing an integrated mass-spectrographic peak area above the integration line and an area which is found under the integrated peak area of the target analyte by perpendicular drop lines from the peak integration line and forming a mathematical relationship from the determined mass-spectrographic areas.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.