High energy X-ray inspection system using a fan-shaped beam and collimated backscatter detectors
US8831176B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 20, 2009 |
| Grant date | Sep 9, 2014 |
| Priority date | — |
| Expiry date | Dec 29, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/053
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
This invention provides a scanning system for scanning an object in a scanning zone. The scanning system includes both a radiation source arranged to irradiate the object with radiation having a peak energy of at least 900 keV and a scatter detector arranged to detect radiation scattered from the object wherein the radiation source is arranged to irradiate the object over a plurality of regions to be scanned within a single irradiation event. The scatter detector includes a plurality of detection elements, each detection element being arranged to detect scattered radiation from a predefined part of the scanning zone and a signal processor arranged to calculate scatter intensity across the plurality of detector elements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.