Patent · US Active

Pseudo dual-energy material identification system and method with undersampling

US8831305B2 · kind B2 · utility

7Cited by

3References

18Claims

0Family size

Assignees

TSINGHUA UNIVERSITY · CN
NUCTECH COMPANY LIMITED · CN

Inventors

Li Zhang · Beijing, CN
Zhiqiang Chen · Beijing, CN
Yuanyuan Liu · Shanghai, CN
Yuxiang Xing · Beijing, CN
Ziran Zhao · Beijing, CN

Key dates

Filing date	Dec 30, 2009
Grant date	Sep 9, 2014
Priority date	—
Expiry date	May 8, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG06T2211/408
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Pseudo dual-energy material identification systems and methods with under-sampling are disclosed. The system comprises a ray generating device, a mechanic rotation control section, a data collecting subsystem comprising a first tier of detectors and a second tier of detectors, and a master control and data processing computer. The system utilizes a CT-imaging-based material identification method with under-sampled dual-energy projection data, in which only a few detectors at the second tier are used to perform dual-energy projection data sampling, and optimization is made on the procedure of solving an equation system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.