Systems and methods for efficient spatial feature analysis
US8832593B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 16, 2011 |
| Grant date | Sep 9, 2014 |
| Priority date | — |
| Expiry date | Apr 19, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T11/00
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems (100) and methods (300) for efficient spatial feature data analysis. The methods involve simultaneously generating two or more chip images (904) using image data defining a first image (508); concurrently displaying an array (906) comprising all or a portion of the chip images in a plug-in window (702); and displaying in the plug-in window information relating to an attribute (a1, a2) of a feature (A5) contained in a selected one of the displayed chip images (1002). The chip images are generated in response to a user selection of a feature (A1) contained in at least a portion of the first image displayed in an application window (504). Each of the chip images comprises a panned view, a zoomed view, or a panned-and-zoomed view of the first image including one or more features of a user-selected feature class.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.