Topology design using squish patterns
US8832621B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 28, 2011 |
| Grant date | Sep 9, 2014 |
| Priority date | — |
| Expiry date | May 17, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/398
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for evaluating a design layout by identifying squish patterns for configurations of shapes in windows defined for anchors in the layout, identifying deltas between edges of elements in the windows and reducing each delta to a single width are described. Identified squish patterns may be compared to known patterns to determine if the squish pattern is a known good or bad pattern. A squish pattern may be represented by a pixel map such that each pixel is a reduced delta in the window and each pixel has a bit representing a layer in a multi-layer layout. A plurality of stored squish patterns may be searched to identify a matching squish pattern, a specific configuration of the squish pattern, or configurations of the squish pattern having deltas within a specified range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.