Systems and methods for weigh scale perimeter monitoring for scanner-scales
US8833659B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 18, 2013 |
| Grant date | Sep 16, 2014 |
| Priority date | — |
| Expiry date | Oct 18, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01G19/52
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for reducing erroneous weighing of items such as by detecting items extending beyond a periphery of a weigh platter whereby in one configuration, the system employs a light guide for routing a light beam to a detector operative to detect interruption of the beam due to an item encroaching upon or overhanging an edge of the platter. In another configuration, the scale includes a perimeter gap between the platter outer edge and scanner housing frame or checkout counter, a light beam directed angularly upward through the gap is partially obstructed by the frame and platter whereby light exits the gap forming a light plane, wherein an object placed on the platter extending across the gap intersects the light plane thus scattering light rays, some of which are sensed by a detector. Various indicators for alerting the operator of off-scale detection are also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.