Method for manufacturing a semiconductor device
US8835325B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 12, 2011 |
| Grant date | Sep 16, 2014 |
| Priority date | — |
| Expiry date | Dec 12, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/32051
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
The present invention discloses a method of manufacturing a semiconductor device. In order to form a trench with a smaller width, patterns of various monomers are formed by utilizing self-assembly characteristics of a block copolymer comprising various monomers. A metal or metal nitride is deposited on a surface of the block copolymer, the metal or metallic nitride selectively depositing due to a preferential chemical affinity between various monomers and the metal or metal nitride. After reaching a certain thickness, the metal or metal nitride layer begins to grow laterally. Deposition can be stopped by controlling deposition time so that the metal or metal nitride layer grows laterally but does not completely cover the surface of the block copolymer. Etching is then conducted using the metal or metal nitride layer as a mask to obtain a trench with a very small width.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.