Device characterization system and methods
US8836536B2 · kind B2 · utility
157Cited by
1References
16Claims
0Family size
Assignee
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Key dates
| Filing date | Jul 29, 2011 |
| Grant date | Sep 16, 2014 |
| Priority date | — |
| Expiry date | May 29, 2033 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04Q2209/845
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
In an embodiment, a device characterization system includes a sensor to sense an attribute of a device, a processor, and an algorithm executable on the processor to collect time series data of the attribute from the sensor, detect edges in the data, identify clusters from the edges, label the clusters based on input from a supervisor, and estimate device characterization parameters from the clusters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.