Systems and methods for fast measurement of channel performance metrics such as error margin and off-track recording capability in shingled magnetic recording
US8837065B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 18, 2013 |
| Grant date | Sep 16, 2014 |
| Priority date | — |
| Expiry date | Dec 18, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B20/10305
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods for making fast measurements of channel performance metrics such as error margin and off-track recording capability in shingled magnetic recording are provided. One such method involves writing a plurality of shingled tracks on the disk, measuring an off track read capability (OTRC) of each of the plurality of shingled tracks, determining radial endpoints of the measured OTRC for each of the plurality of shingled tracks, determining an approximate radial center for each of the plurality of shingled tracks based on the respective OTRC radial endpoints, and measuring a channel performance metric at a range centered around the approximate radial center for each of the plurality of shingled tracks. In one such case, the channel performance metric involves error margin. One such system includes a processor coupled to a memory, a magnetic transducer, and a test platform, where the processor is configured to perform the method.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.