Amplitude flatness and phase linearity calibration for RF sources
US8842771B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 20, 2012 |
| Grant date | Sep 23, 2014 |
| Priority date | — |
| Expiry date | Nov 20, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/104
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
An amplitude flatness and phase linearity calibration method for an RF source across a wide frequency bandwidth uses a simple square law diode detector and at least a pair of equal amplitude frequency tones. A baseband generator for the RF source generates the tones, which are applied in series to a correction filter and an up-converter to produce an output RF signal. The tones are stepped across a specified frequency bandwidth, and at each average frequency for the tones a magnitude and group delay is measured as well as a phase for the beat frequency between the tones. The resulting measurements are used to calibrate filter coefficients for the correction filter to assure amplitude flatness and phase linearity across the specified frequency bandwidth.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.