System state based diagnostic scan
US8844042B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 16, 2010 |
| Grant date | Sep 23, 2014 |
| Priority date | — |
| Expiry date | May 12, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F21/577
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In some embodiments, a local agent on a target system may evaluate current and/or historical system state information from a store (either local or remote) and dynamically adjust the level of diagnosis performed during the scan based on the evaluated state information. Individual diagnostic scans may, for example, be enabled and disabled based on the context in the store, and each scan may update the context for further evaluation. By employing such an approach, systems with a low risk profile and lacking symptoms of a problem may be scanned quickly while systems that show signs of a problem or have a high risk profile may receive a more thorough evaluation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.