Patent · US Active

Diode laser and method for manufacturing a high-efficiency diode laser

US8846425B2 · kind B2 · utility

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6References
14Claims
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Key dates

Filing dateNov 21, 2012
Grant dateSep 30, 2014
Priority date
Expiry dateNov 21, 2032

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01S2304/00
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A diode laser having aluminum-containing layers and a Bragg grating for stabilizing the emission wavelength achieves an improved output/efficiency. The growth process is divided into two steps for introducing the Bragg grating, wherein a continuous aluminum-free layer and an aluminum-free mask layer are continuously deposited after the first growth process such that the aluminum-containing layer is completely covered by the continuous aluminum-free layer. Structuring is performed outside the reactor without unwanted oxidation of the aluminum-containing semiconductor layer. Subsequently, the pre-structured semiconductor surface is further etched inside the reactor and the structuring is impressed into the aluminum-containing layer. In this process, so little oxygen is inserted into the semiconductor crystal of the aluminum-containing layers in the environment of the grating that output and efficiency of a diode laser are not reduced as compared to a diode laser without grating layers that was produced in an epitaxy step.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.